We have developed a scintillator-based beam monitor (SBM) for real-time beam analysis over a wide range of isotopes, energies and intensities. It has attracted particular attention at facilities where single-particle and fast beam imaging and tuning are at a premium. Two types of proprietary scintillators are used: 1) a semi-crystalline polymer material (PM) with a thickness of ~1 to 200 microns, yielding stronger signals per unit thickness than tested PVT-based plastic scintillators; 2) a hybrid material (HM) of ~100-400 microns thick, yielding order-of-magnitude larger signals per unit thickness than single crystal CsI(Tl), producing sharp beam images with minimal internal reflections. These scintillators are non-hygroscopic with HM being especially radiation damage resistant. An SBM prototype was staged at FRIB with a 2.7 MeV/u ion-beam of Kr-86 demonstrating real-time beam profiles and rate analysis from single-particles to >10^5 pps with ~20 micron spatial resolution. A commercialized second-generation SBM product was installed and successfully tested on the ReA3-SECAR FRIB beamline using a 4.5 MeV/u beam of mixed and “pure” Cl-35 and N-14 ions over a range from 10-10^7 pps.